MS connector [F6 series]

Inspection errors on RF transmission gear can be caused by inappropriate test probe mating with the product. Some probe manufacturers do not allow enough tolerance to prevent such mating errors.

Hirose developed our new inspection probe to resolve this headache. Our new F6 probe design will improve your inspection process and is ready for higher frequencies for the future smart phone market.

F6 probes can float in X, Y and Z directions to tolerate misalignment

Our F6 series probes have a unique floating function in the X, Y and Z directions to self-align with the board mounted switch. The video below shows how the Hirose probe reduces misalignment in your manufacturing inspection line.

How it works

F6 probes can tolerate misalignment without the tip of the probe shifting out of center due to cable motion.

Lower portion:
Tolerant of misalignment with a unique floating feature

Top portion:
No moving parts on the flange portion which is fixed to the test fixture

Actual measurement results

The amazing performance shown below was under an intentionally misaligned test. Note the consistent results throughout the testing.
Competitive products have test failure rates of over 1000ppm. The Hirose test probes reduce this number to about 100ppm making our product the best choice for high volume applications.

Product lineup

Series name	Product name	Conversion adapter type	Features	Target connector
MS-156C	MS-156-HRMJ-F6	SMA jack	Floating structure for up to 6 GHz	Common SMA harness
MS-180	MS-180-HRMJ-F6	SMA jack	Floating structure for up to 6 GHz	Common SMA harness
	MS-180-SMPMP(FD)-F6	SMPM plug	Floating structure for up to 6 GHz, small diameter type (5 mm pitch can be arranged)	Common SMPM harness
	MS-180-ML51.J-F6	ML51 jack	Floating structure for up to 6 GHz, small diameter type (5 mm pitch can be arranged)	ML51 harness
MS-190	MS-190-HRMJ-F6	SMA jack	Floating structure for up to 6 GHz	Common SMA harness