MS connector [F6 series]
Is your RF production cost increasing due to inspection errors?
You are not alone.
The engineers Hirose have a solution perfect for your business.
Inspection errors on RF transmission gear can be caused by inappropriate test probe mating with the product. Some probe manufacturers do not allow enough tolerance to prevent such mating errors.
Hirose developed our new inspection probe to resolve this headache. Our new F6 probe design will improve your inspection process and is ready for higher frequencies for the future smart phone market.
F6 probes can float in X, Y and Z directions to tolerate misalignment
Our F6 series probes have a unique floating function in the X, Y and Z directions to self-align with the board mounted switch. The video below shows how the Hirose probe reduces misalignment in your manufacturing inspection line.
How it works
F6 probes can tolerate misalignment without the tip of the probe shifting out of center due to cable motion.
Tolerant of misalignment with a unique floating feature
No moving parts on the flange portion which is fixed to the test fixture
Actual measurement results
The amazing performance shown below was under an intentionally misaligned test. Note the consistent results throughout the testing.
Competitive products have test failure rates of over 1000ppm. The Hirose test probes reduce this number to about 100ppm making our product the best choice for high volume applications.
|Series||MS-156C series||MS-180 series||MS-190 series|
*mate with MS-156C series
*mate with MS-180 series
*mate with MS-190 series