MS connector [F6 series]
The production cost is increasing due to the inspection error. We found a lot of our customers have similar issue although it is not in our daily conversation.
From time to time, the inspection error on RF transmission is due to inspection probe inappropriately mated with the product instead of the product itself. The other vendors’ probe design do not give enough room to tolerant such mating error.
Hirose developed the new inspection probe to resolve this headache. Our new F6 probes design can help to improve the inspection process and it is also capable for higher frequency for future smart phone market.
Tip of F6 probes can float in X, Y and Z directions to tolerate misalignment
F6 probes have floating functions in X, Y and Z directions to align itself with the switch. The clip below shows how this probe reduce the typical misalignment which usually occurs in manufacturing inspection line.
Features：the explanation about structure and actual measurement
F6 probes can tolerant misalignment with no probing tip shift out of center due to cable pulling
Lower portion: Tolerant misalignment with floating feature
Top portion: No moving parts for flange portion is fixed on the test fixture
Actual measurement results
The steady results show below was under intentionally misaligned situation.
Customers who have the range of 1000ppm mating issue could solve the problem with F6 probes
|Series||MS-156C series||MS-180 series||MS-190 series|
*mate with MS-156C series
*mate with MS-180 series
*mate with MS-190 series